Out of eight major semiconductor processes, the 'probe station' sorts out defective wafers during the transition from the initial process to the back-end process. This station is an automated facility that connects to the tester to check the electrical function of the IC formed in the wafer. Its core function is to ensure the probe card needles make precise contact (±1㎛) with the pad in the wafer chip by aligning the probe card and the wafer in place.
This new 'probe station' is designed to emphasise the company's unique colour palette. The image of the product transforms from complex and mechanical to simple and modern. To aid the worker during the process, an interactive LED display with an operator gives a human touch. The monitor with 180-degree rotation and a ball joint structure considers the worker's convenience. A safety cover for the OHT system guarantees the safety of the worker.
SEMES, South Korea
Cho Sue Jin
Choi Si Yong, Hwang In Wook, Kim Ki Yong, Dr. Kim Myung Suk, Kim Woo Yeol, Kim Yong Ku, Lee Sang Hee, Moon Joon Duk, Park Geon Hee